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International Symposium on Quality Electronic Design (ISQED '01)
A Model for Crosstalk Noise Evaluation in Deep Submicron Processes
San Jose, California
March 26-March 28
ISBN: 0-7695-1025-6
ASCII Text
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Pirouz Bazargan Sabet, Fabrice Ilponse, "A Model for Crosstalk Noise Evaluation in Deep Submicron Processes," Quality Electronic Design, International Symposium on, pp. 139, International Symposium on Quality Electronic Design (ISQED '01), 2001.
 
 
BibTex
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@article{ 10.1109/ISQED.2001.915218,
author = {Pirouz Bazargan Sabet and Fabrice Ilponse},
title = {A Model for Crosstalk Noise Evaluation in Deep Submicron Processes},
journal ={Quality Electronic Design, International Symposium on},
volume = {0},
year = {2001},
isbn = {0-7695-1025-6},
pages = {139},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2001.915218},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Quality Electronic Design, International Symposium on
TI - A Model for Crosstalk Noise Evaluation in Deep Submicron Processes
SN - 0-7695-1025-6
SP
EP
A1 - Pirouz Bazargan Sabet,
A1 - Fabrice Ilponse,
PY - 2001
VL - 0
JA - Quality Electronic Design, International Symposium on
ER -
 
Pirouz Bazargan Sabet, University of Paris 6
Fabrice Ilponse, ST-Microelectronics
To certify the correctness of a design, in deep submicron technologies, the verification process has to cover some new issues. The noise introduced on signals through the crosstalk coupling is one of these emerging problems. In this paper, we propose a model to evaluate the peak value of the noise injected on a signal during the transition of its neighboring signals. This model has been used in a prototype verification tool and has shown a satisfying accuracy within a reasonable computation delay.
Citation:
Pirouz Bazargan Sabet, Fabrice Ilponse, "A Model for Crosstalk Noise Evaluation in Deep Submicron Processes," isqed, pp.139, International Symposium on Quality Electronic Design (ISQED '01), 2001
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