Noise Safety Design Methodologies

I
ISQED
2000
First International Symposium on Quality of Electronic Design
Abstract - Noise Safety Design Methodologies

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	Similar Articles Articles by M. Graziano Articles by M. Delaurenti Articles by G. Masera Articles by G. Piccinini Articles by M. Zamboni

First International Symposium on Quality of Electronic Design

San Jose, California

March 20-March 22

ISBN: 0-7695-0525-2

	ASCII Text	x
	M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni, "Noise Safety Design Methodologies," Quality Electronic Design, International Symposium on, pp. 157, First International Symposium on Quality of Electronic Design, 2000.

	BibTex	x
	@article{ 10.1109/ISQED.2000.838869, author = {M. Graziano and M. Delaurenti and G. Masera and G. Piccinini and M. Zamboni}, title = {Noise Safety Design Methodologies}, journal ={Quality Electronic Design, International Symposium on}, volume = {0}, year = {2000}, isbn = {0-7695-0525-2}, pages = {157}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2000.838869}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Quality Electronic Design, International Symposium on TI - Noise Safety Design Methodologies SN - 0-7695-0525-2 SP EP A1 - M. Graziano, A1 - M. Delaurenti, A1 - G. Masera, A1 - G. Piccinini, A1 - M. Zamboni, PY - 2000 KW - Noise KW - Noise Models KW - Electromigration Safety KW - Noise Tolerance KW - Deep-submicron Design Reliability VL - 0 JA - Quality Electronic Design, International Symposium on ER -

M. Graziano, Politecnico di Torino

M. Delaurenti, Politecnico di Torino

G. Masera, Politecnico di Torino

G. Piccinini, Politecnico di Torino

M. Zamboni, Politecnico di Torino

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISQED.2000.838869

The increasing densities in growing size circuits leads to consider as an issue noise problems as crosstalk, switching noise, electromigration and substrate injection. Noise safety must be a clear objective in design tools, which development must then include circuit models for the analysis of noise phenomena. This paper point out a proposed methodology in the developing of new models and related tools that focuses on noise immunity of circuit design.

Index Terms:

Noise, Noise Models, Electromigration Safety, Noise Tolerance, Deep-submicron Design Reliability

Citation:

M. Graziano, M. Delaurenti, G. Masera, G. Piccinini, M. Zamboni, "Noise Safety Design Methodologies," isqed, pp.157, First International Symposium on Quality of Electronic Design, 2000

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