Data Dependence Analysis for Intra-Register Vectorization

I
ISPDC
2003
Second International Symposium on Parallel and Distributed Computing
Abstract - Data Dependence Analysis for Intra-Register Vectorization

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	Similar Articles Articles by Patricio Bulic Articles by Veselko Gustin

Second International Symposium on Parallel and Distributed Computing

Ljubljana, Slovenia

October 13-October 14

ISBN: 0-7695-2069-3

	ASCII Text	x
	Patricio Bulic, Veselko Gustin, "Data Dependence Analysis for Intra-Register Vectorization," Parallel and Distributed Computing, International Symposium on, pp. 50, Second International Symposium on Parallel and Distributed Computing, 2003.

	BibTex	x
	@article{ 10.1109/ISPDC.2003.1267643, author = {Patricio Bulic and Veselko Gustin}, title = {Data Dependence Analysis for Intra-Register Vectorization}, journal ={Parallel and Distributed Computing, International Symposium on}, volume = {0}, year = {2003}, isbn = {0-7695-2069-3 }, pages = {50}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISPDC.2003.1267643}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Parallel and Distributed Computing, International Symposium on TI - Data Dependence Analysis for Intra-Register Vectorization SN - 0-7695-2069-3 SP EP A1 - Patricio Bulic, A1 - Veselko Gustin, PY - 2003 KW - null VL - 0 JA - Parallel and Distributed Computing, International Symposium on ER -

Patricio Bulic, University of Ljubljana, Slovenia

Veselko Gustin, University of Ljubljana, Slovenia

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISPDC.2003.1267643

There are a number of data dependence tests that have been proposed in the literature. In each test there is a different trade-off between accuracy and efficiency. The most widely used approximate data dependence tests are the Banerjee inequality and the GCD test; whereas the Omega test is a well-known exact data dependence test.

In this paper we present a new, fast data dependence test for array references with linear subscripts, which is used in a vectorizing compiler for microprocessors with a multimedia extension. Our test is suitable for use in a dependence analyser that is organized is as a series of tests, progressively increasing in accuracy, as a replacement for the GCD or Banerjee tests.

Citation:

Patricio Bulic, Veselko Gustin, "Data Dependence Analysis for Intra-Register Vectorization," ispdc, pp.50, Second International Symposium on Parallel and Distributed Computing, 2003

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