Multiple-Input Resonant-Tunneling Logic Gates for Flash A/D Converter Applications

I
ISMVL
2004
34th International Symposium on Multiple-Valued Logic (ISMVL'04)
Abstract - Multiple-Input Resonant-Tunneling Logic Gates for Flash A/D Converter Applications

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Yuki Tsuji Articles by Takao Waho

34th International Symposium on Multiple-Valued Logic (ISMVL'04)

University of Toronto, Toronto, Canada

May 19-May 22

ISBN: 0-7695-2130-4

	ASCII Text	x
	Yuki Tsuji, Takao Waho, "Multiple-Input Resonant-Tunneling Logic Gates for Flash A/D Converter Applications," Multiple-Valued Logic, IEEE International Symposium on, pp. 8-13, 34th International Symposium on Multiple-Valued Logic (ISMVL'04), 2004.

	BibTex	x
	@article{ 10.1109/ISMVL.2004.1319912, author = {Yuki Tsuji and Takao Waho}, title = {Multiple-Input Resonant-Tunneling Logic Gates for Flash A/D Converter Applications}, journal ={Multiple-Valued Logic, IEEE International Symposium on}, volume = {0}, year = {2004}, issn = {0195-623X}, pages = {8-13}, doi = {http://doi.ieeecomputersociety.org/10.1109/ISMVL.2004.1319912}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Multiple-Valued Logic, IEEE International Symposium on TI - Multiple-Input Resonant-Tunneling Logic Gates for Flash A/D Converter Applications SN - 0195-623X SP8 EP13 A1 - Yuki Tsuji, A1 - Takao Waho, PY - 2004 KW - null VL - 0 JA - Multiple-Valued Logic, IEEE International Symposium on ER -

Yuki Tsuji, Sophia University

Takao Waho, Sophia University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISMVL.2004.1319912

Multiple-inputresonant-tunneling (RT) logic gates have been proposed for flash analog-to-digital converter applications. An error-mode operation has been found in conventional RT gates called MOBILE when the number of input increases. By introducing an RTD/HEMT series connection to suppress the error operation, we can successfully design 4-, 8-, and 16-input RT gates, which are essential to obtain compact flash ADCs.

Citation:

Yuki Tsuji, Takao Waho, "Multiple-Input Resonant-Tunneling Logic Gates for Flash A/D Converter Applications," ismvl, pp.8-13, 34th International Symposium on Multiple-Valued Logic (ISMVL'04), 2004

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.