Y. Nagata, D. Miller, M. Mukaidono, "Minimal Test Set Generation for Fault Diagnosis in R-Valued PLAs," Multiple-Valued Logic, IEEE International Symposium on, pp. 38, The 28th International Symposium on Multiple-Valued Logic, 1998.

@article{ 10.1109/ISMVL.1998.679273,
author = {Y. Nagata and D. Miller and M. Mukaidono},
title = {Minimal Test Set Generation for Fault Diagnosis in R-Valued PLAs},
journal ={Multiple-Valued Logic, IEEE International Symposium on},
volume = {0},
year = {1998},
issn = {0195-623X},
pages = {38},
doi = {http://doi.ieeecomputersociety.org/10.1109/ISMVL.1998.679273},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - Multiple-Valued Logic, IEEE International Symposium on
TI - Minimal Test Set Generation for Fault Diagnosis in R-Valued PLAs
SN - 0195-623X
SP
EP
A1 - Y. Nagata,
A1 - D. Miller,
A1 - M. Mukaidono,
PY - 1998
VL - 0
JA - Multiple-Valued Logic, IEEE International Symposium on
ER -