11th IEEE Symposium on Computers and Communications (ISCC'06) Wavelet Based RDNN for Software Reliability Estimation Cagliari, Sardinia, Italy June 26-June 29 ISBN: 0-7695-2588-1
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ISCC.2006.168
Using the wavelet basis in Recurrent Dynamic Neural Network (RDNN) can improve the failure event estimation of software defect tracking in telecommunications. Non-linearity of the system is represented by proper selection of the wavelet function. This RDNN handles noisy data and enhances the speed of convergence as compared with alternate approaches. A new adaptive RDNN is presented where software deployment testing observations are used to synthesize intrinsic model parameters.
Citation:
Adam Smiarowski, Jr., Hoda S. Abdel-Aty-Zohdy, Mostafa Hashem Sherif, Hemal Shah, "Wavelet Based RDNN for Software Reliability Estimation," iscc, pp.312-317, 11th IEEE Symposium on Computers and Communications (ISCC'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||