2008 14th IEEE International On-Line Testing Symposium A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies July 07-July 09 ISBN: 978-0-7695-3264-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2008.9
Soft errors induced by cosmic radiation have become an urgent issue for Ultra-Deep-Sub-Micron (UDSM) Technologies. In this paper, we propose a new Radiation Hardened By Design Latch (RHBDL). RHBDL can improve robustness by masking the soft errors induced by SEU and SET. We evaluate the propagation delay, power dissipation and power delay product of RHBDL using SPICE simulations. Compared with existing reported solutions such as TMR-Latch, RHBDL is less SEU-sensitive, more area efficient, delay and power efficient.
Index Terms:
soft error, RHBD, dual interlock, internal feedback
Citation:
Zhengfeng Huang, Huaguo Liang, "A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies," iolts, pp.175-176, 2008 14th IEEE International On-Line Testing Symposium, 2008 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb