13th IEEE International On-Line Testing Symposium (IOLTS 2007) Heraklion, Crete, Greece July 08-July 11 ISBN: 0-7695-2918-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.62
We will mainly address here the "alter ego" of quality, which is reliability, and is becoming a growing concern for designers using the latest technologies. After the DFM nodes in 90nm and 65nm, we are entering the DFR area, or Design For Reliability straddling from 65nm to 45nm and beyond. Because of the randomness character of reliability - failures can happen anytime anywhere - executives should mitigate reliability problems in terms of risk, which costs include cost of recalls, warranty costs, and loss of goodwill.
Citation:
Mark Derbey, "Soft-Errors Phenomenon Impacts on Design for Reliability Technologies," iolts, pp.7, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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