Self Checking Circuit Optimization by means of Fault Injection Analysis: A Case Study on Reed Solomon Decoders

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	Similar Articles Articles by S. Pontarelli Articles by L. Sterpone Articles by G.C. Cardarilli Articles by M. Re Articles by M. Sonza Reorda Articles by A. Salsano Articles by M. Violante

13th IEEE International On-Line Testing Symposium (IOLTS 2007)

Heraklion, Crete, Greece

July 08-July 11

ISBN: 0-7695-2918-6

	ASCII Text	x
	S. Pontarelli, L. Sterpone, G.C. Cardarilli, M. Re, M. Sonza Reorda, A. Salsano, M. Violante, "Self Checking Circuit Optimization by means of Fault Injection Analysis: A Case Study on Reed Solomon Decoders," IEEE International On-Line Testing Symposium, pp. 194-196, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.

	BibTex	x
	@article{ 10.1109/IOLTS.2007.58, author = {S. Pontarelli and L. Sterpone and G.C. Cardarilli and M. Re and M. Sonza Reorda and A. Salsano and M. Violante}, title = {Self Checking Circuit Optimization by means of Fault Injection Analysis: A Case Study on Reed Solomon Decoders}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2007}, isbn = {0-7695-2918-6}, pages = {194-196}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.58}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - Self Checking Circuit Optimization by means of Fault Injection Analysis: A Case Study on Reed Solomon Decoders SN - 0-7695-2918-6 SP194 EP196 A1 - S. Pontarelli, A1 - L. Sterpone, A1 - G.C. Cardarilli, A1 - M. Re, A1 - M. Sonza Reorda, A1 - A. Salsano, A1 - M. Violante, PY - 2007 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

S. Pontarelli, University of Rome "Tor Vergata", Italy

L. Sterpone, Politecnico di Torino, Italy

G.C. Cardarilli, University of Rome "Tor Vergata", Italy

M. Re, University of Rome "Tor Vergata", Italy

M. Sonza Reorda, Politecnico di Torino, Italy

A. Salsano, University of Rome "Tor Vergata", Italy

M. Violante, Politecnico di Torino, Italy

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.58

This paper shows how the use of exhaustive fault injection campaigns in conjunction with the analysis of the property of a circuit, allows to improve the efficiency of the checker of self checking circuits. Experimental results coming from fault injection campaigns on a Reed-Solomon Decoder demonstrated that by observing the occurred errors and the correspondent detection module has been possible to reduce the number of detection module, while paying a small reduction of the percentage of SEUs that can be detected.

Citation:

S. Pontarelli, L. Sterpone, G.C. Cardarilli, M. Re, M. Sonza Reorda, A. Salsano, M. Violante, "Self Checking Circuit Optimization by means of Fault Injection Analysis: A Case Study on Reed Solomon Decoders," iolts, pp.194-196, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

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