LFSR Reseeding with Irreducible Polynomials

I
IOLTS
2007
13th IEEE International On-Line Testing Symposium (IOLTS 2007)
Abstract - LFSR Reseeding with Irreducible Polynomials

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	Similar Articles Articles by Snehal Udar Articles by Dimitri Kagaris

13th IEEE International On-Line Testing Symposium (IOLTS 2007)

Heraklion, Crete, Greece

July 08-July 11

ISBN: 0-7695-2918-6

	ASCII Text	x
	Snehal Udar, Dimitri Kagaris, "LFSR Reseeding with Irreducible Polynomials," On-Line Testing Symposium, IEEE International, pp. 293-298, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.

	BibTex	x
	@article{ 10.1109/IOLTS.2007.43, author = {Snehal Udar and Dimitri Kagaris}, title = {LFSR Reseeding with Irreducible Polynomials}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2007}, isbn = {0-7695-2918-6}, pages = {293-298}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.43}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - LFSR Reseeding with Irreducible Polynomials SN - 0-7695-2918-6 SP293 EP298 A1 - Snehal Udar, A1 - Dimitri Kagaris, PY - 2007 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

Snehal Udar, Southern Illinois University, USA

Dimitri Kagaris, Southern Illinois University, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.43

We propose an innovative scheme for LFSR reseeding based on the efficient generation of the seeds of any non-primitive irreducible polynomial. The scheme has very small hardware overhead irrespective of the number of seeds and guarantees that the generation of the pattern subsequence from each seed is disjoint. Experimental results demonstrate the potential of the mechanism for pseudorandom test pattern generation in a parallel chain test-per-scan environment.

Citation:

Snehal Udar, Dimitri Kagaris, "LFSR Reseeding with Irreducible Polynomials," iolts, pp.293-298, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

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