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13th IEEE International On-Line Testing Symposium (IOLTS 2007)
Heraklion, Crete, Greece
July 08-July 11
ISBN: 0-7695-2918-6
X. Cano, U. Barcelona, Spain
S. Bota, GTE, U. Illes Balears
R. Graciani, U. Barcelona, Spain
D. Gasc?, U. Barcelona, Spain
A. Herms, U. Barcelona, Spain
A. Comerma, U. Barcelona, Spain
J. Segura, GET, U. Illes Balears.
L. Garrido, U. Barcelona, Spain
A heavy ion radiation test has been performed to evaluate the SEU sensitivity on a mixed-mode ASIC. We present the results obtained when the Triple Voting Registers used in the digital block of the ASIC are irradiated with heavy ions.
Citation:
X. Cano, S. Bota, R. Graciani, D. Gasc?, A. Herms, A. Comerma, J. Segura, L. Garrido, "Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment," iolts, pp.183-184, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
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