13th IEEE International On-Line Testing Symposium (IOLTS 2007) Heraklion, Crete, Greece July 08-July 11 ISBN: 0-7695-2918-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.36
A heavy ion radiation test has been performed to evaluate the SEU sensitivity on a mixed-mode ASIC. We present the results obtained when the Triple Voting Registers used in the digital block of the ASIC are irradiated with heavy ions.
Citation:
X. Cano, S. Bota, R. Graciani, D. Gasc?, A. Herms, A. Comerma, J. Segura, L. Garrido, "Heavy Ion Test Results in a CMOS triple Voting Register for a High-Energy Physics Experiment," iolts, pp.183-184, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||