Embedding test patterns into Low-Power BIST sequences

I
IOLTS
2007
13th IEEE International On-Line Testing Symposium (IOLTS 2007)
Abstract - Embedding test patterns into Low-Power BIST sequences

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13th IEEE International On-Line Testing Symposium (IOLTS 2007)

Embedding test patterns into Low-Power BIST sequences (PDF)

Heraklion, Crete, Greece

July 08-July 11

ISBN: 0-7695-2918-6

	ASCII Text	x
	Ioannis Voyiatzis, "Embedding test patterns into Low-Power BIST sequences," On-Line Testing Symposium, IEEE International, pp. 197-198, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.

	BibTex	x
	@article{ 10.1109/IOLTS.2007.29, author = {Ioannis Voyiatzis}, title = {Embedding test patterns into Low-Power BIST sequences}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2007}, isbn = {0-7695-2918-6}, pages = {197-198}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.29}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - Embedding test patterns into Low-Power BIST sequences SN - 0-7695-2918-6 SP197 EP198 A1 - Ioannis Voyiatzis, PY - 2007 KW - Built-In Self Test KW - Test set embedding KW - Gray sequences KW - Low power sequences VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

Ioannis Voyiatzis, Technological Educational Institute of Athens, Greece

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.29

Current trends in VLSI designs necessitate low power during both normal system operation and testing activity. Traditional Built-in Self Test (BIST) generators rise the power and energy consumption during testing, boosting the need to add low-power solutions to the arsenal of BIST pattern generators.

In this work, the utilization of gray code generators is proposed as a low-power BIST solution; more precisely, we propose an algorithm to embed a test pattern into a sequence generated by a gray code generator. Hence, test sets can be embedded into gray sequences.

Index Terms:

Built-In Self Test, Test set embedding, Gray sequences, Low power sequences

Citation:

Ioannis Voyiatzis, "Embedding test patterns into Low-Power BIST sequences," iolts, pp.197-198, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

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