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13th IEEE International On-Line Testing Symposium (IOLTS 2007)
Design for Resilience to Soft Errors and Variations
Heraklion, Crete, Greece
July 08-July 11
ISBN: 0-7695-2918-6
ASCII Text
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Ming Zhang, T.M. Mak, Jim Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu, "Design for Resilience to Soft Errors and Variations," IEEE International On-Line Testing Symposium, pp. 23-28, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.
 
 
BibTex
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@article{ 10.1109/IOLTS.2007.26,
author = {Ming Zhang and T.M. Mak and Jim Tschanz and Kee Sup Kim and Norbert Seifert and Davia Lu},
title = {Design for Resilience to Soft Errors and Variations},
journal ={IEEE International On-Line Testing Symposium},
volume = {0},
year = {2007},
isbn = {0-7695-2918-6},
pages = {23-28},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.26},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - IEEE International On-Line Testing Symposium
TI - Design for Resilience to Soft Errors and Variations
SN - 0-7695-2918-6
SP23
EP28
A1 - Ming Zhang,
A1 - T.M. Mak,
A1 - Jim Tschanz,
A1 - Kee Sup Kim,
A1 - Norbert Seifert,
A1 - Davia Lu,
PY - 2007
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium
ER -
 
Ming Zhang, Intel Corporation
T.M. Mak, Intel Corporation
Jim Tschanz, Intel Corporation
Kee Sup Kim, Intel Corporation
Norbert Seifert, Intel Corporation
Davia Lu, Intel Corporation
This paper presents Adaptive Variation-and-Error- Resilient Agent (AVERA), an approach to address the challenge of designing reliable systems in the presence of soft errors and variations. AVERA extends our previous Built-In Soft Error Resilience (BISER) approach by adding additional capabilities to support process variation diagnosis, degradation detection, and system adaptation, besides soft error correction. We also discuss open challenges for building variation-and-error-resilient systems.
Citation:
Ming Zhang, T.M. Mak, Jim Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu, "Design for Resilience to Soft Errors and Variations," iolts, pp.23-28, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007
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