An Analytical Model for Reliability Evaluation of NoC Architectures

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	Similar Articles Articles by Atefe Dalirsani Articles by Mohammad Hosseinabady Articles by Zainalabedin Navabi

13th IEEE International On-Line Testing Symposium (IOLTS 2007)

Heraklion, Crete, Greece

July 08-July 11

ISBN: 0-7695-2918-6

	ASCII Text	x
	Atefe Dalirsani, Mohammad Hosseinabady, Zainalabedin Navabi, "An Analytical Model for Reliability Evaluation of NoC Architectures," IEEE International On-Line Testing Symposium, pp. 49-56, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.

	BibTex	x
	@article{ 10.1109/IOLTS.2007.13, author = {Atefe Dalirsani and Mohammad Hosseinabady and Zainalabedin Navabi}, title = {An Analytical Model for Reliability Evaluation of NoC Architectures}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2007}, isbn = {0-7695-2918-6}, pages = {49-56}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.13}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - An Analytical Model for Reliability Evaluation of NoC Architectures SN - 0-7695-2918-6 SP49 EP56 A1 - Atefe Dalirsani, A1 - Mohammad Hosseinabady, A1 - Zainalabedin Navabi, PY - 2007 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

Atefe Dalirsani, University of Tehran, Iran

Mohammad Hosseinabady, University of Tehran, Iran

Zainalabedin Navabi, University of Tehran, Iran

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.13

This paper proposes an analytical model to assess Reliability Factor of an NoC based System-on-Chip design. Reliability Factor is the probability that faults in the NoC infrastructure can be recovered without any effect on system functionality. The proposed method classifies switch faults of an NoC according to their impact on system functionality. Based on this classification, the contribution of each transient fault lowering the reliability of the NoC is calculated. This model can be used to decide which fault tolerant techniques cause more improvement on system reliability.

Citation:

Atefe Dalirsani, Mohammad Hosseinabady, Zainalabedin Navabi, "An Analytical Model for Reliability Evaluation of NoC Architectures," iolts, pp.49-56, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

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