13th IEEE International On-Line Testing Symposium (IOLTS 2007) Heraklion, Crete, Greece July 08-July 11 ISBN: 0-7695-2918-6
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.12
With the increasing need for design specific yield optimization in nanometer technologies, it is becoming increasingly important to accelerate the identification of the root cause of systematic defects under very tight test cost constraints. This talk will give a high level overview of addressing these demanding challenges through a mix of cross-disciplinary EDA technologies spanning scan diagnostics, DFT, ATPG, BIST, DFM and real-time monitoring from ATE systems
Citation:
Sanjiv Taneja, "Accelerating Yield Ramp through Real-Time Testing," iolts, pp.11, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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