A systematic approach for Failure Modes and Effects Analysis of System-On-Chips

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13th IEEE International On-Line Testing Symposium (IOLTS 2007)

A systematic approach for Failure Modes and Effects Analysis of System-On-Chips (PDF)

Heraklion, Crete, Greece

July 08-July 11

ISBN: 0-7695-2918-6

	ASCII Text	x
	R. Mariani, G. Boschi, "A systematic approach for Failure Modes and Effects Analysis of System-On-Chips," IEEE International On-Line Testing Symposium, pp. 187-188, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007.

	BibTex	x
	@article{ 10.1109/IOLTS.2007.10, author = {R. Mariani and G. Boschi}, title = {A systematic approach for Failure Modes and Effects Analysis of System-On-Chips}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2007}, isbn = {0-7695-2918-6}, pages = {187-188}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.10}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - A systematic approach for Failure Modes and Effects Analysis of System-On-Chips SN - 0-7695-2918-6 SP187 EP188 A1 - R. Mariani, A1 - G. Boschi, PY - 2007 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

R. Mariani, YOGITECH, Italy

G. Boschi, YOGITECH, Italy

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2007.10

This paper proposes a method to perform Failure Mode and Effects Analysis (FMEA) on System-On- Chips (SoC). An automatic tool extracts information from the SoC description and uses them to estimate the intrinsic criticality of invariant and elementary "sensitive zones" and to compute metrics such failure rates, safe failures fraction and diagnostic coverage. A validation flow based on fault injection and fault simulation is included to cross check the FMEA.

Citation:

R. Mariani, G. Boschi, "A systematic approach for Failure Modes and Effects Analysis of System-On-Chips," iolts, pp.187-188, 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

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