A Note on Error Detection in an RSA Architecture by Means of Residue Codes

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12th IEEE International On-Line Testing Symposium (IOLTS'06)

A Note on Error Detection in an RSA Architecture by Means of Residue Codes (PDF)

Lake of Como, Italy

July 10-July 12

ISBN: 0-7695-2620-9

	ASCII Text	x
	L. Breveglieri, P. Maistri, I. Koren, "A Note on Error Detection in an RSA Architecture by Means of Residue Codes," IEEE International On-Line Testing Symposium, pp. 176-177, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006.

	BibTex	x
	@article{ 10.1109/IOLTS.2006.8, author = {L. Breveglieri and P. Maistri and I. Koren}, title = {A Note on Error Detection in an RSA Architecture by Means of Residue Codes}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2006}, isbn = {0-7695-2620-9}, pages = {176-177}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.8}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - A Note on Error Detection in an RSA Architecture by Means of Residue Codes SN - 0-7695-2620-9 SP176 EP177 A1 - L. Breveglieri, A1 - P. Maistri, A1 - I. Koren, PY - 2006 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

L. Breveglieri, Politecnico di Milano, Italy

P. Maistri, Politecnico di Milano, Italy

I. Koren, Univ. of Massachusetts, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.8

Recently, various attacks have been proposed against many cryptosystems, exploiting deliberate error injection during the computation process. In this paper, we add a residue-based error detection scheme to an RSA architecture to protect against such attacks. We then evaluate the error coverage and the expected area and latency overheads.

Citation:

L. Breveglieri, P. Maistri, I. Koren, "A Note on Error Detection in an RSA Architecture by Means of Residue Codes," iolts, pp.176-177, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006

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