12th IEEE International On-Line Testing Symposium (IOLTS'06)
A Low-Cost Single-Event Latchup Mitigation Sscheme
Lake of Como, Italy
July 10-July 12
ISBN: 0-7695-2620-9
Single-event latchup is one of the most threatening single event effects as the induced current may destroy the affected device. Existing latchup mitigation schemes may induce a very high area cost or may require modifying the fabrication process. In this paper we present a new single-event latchup mitigation approach implemented at design level that protects devices from destruction and preserve circuit state at very low area cost.
Index Terms:
Latchup, Single-event effects, singleevent lathcup, SEL, mitigation of single-event effects.
Citation:
Michael Nicolaidis, "A Low-Cost Single-Event Latchup Mitigation Sscheme," iolts, pp.111-118, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006