A Low-Cost Single-Event Latchup Mitigation Sscheme

I
IOLTS
2006
12th IEEE International On-Line Testing Symposium (IOLTS'06)
Abstract - A Low-Cost Single-Event Latchup Mitigation Sscheme

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12th IEEE International On-Line Testing Symposium (IOLTS'06)

Lake of Como, Italy

July 10-July 12

ISBN: 0-7695-2620-9

	ASCII Text	x
	Michael Nicolaidis, "A Low-Cost Single-Event Latchup Mitigation Sscheme," On-Line Testing Symposium, IEEE International, pp. 111-118, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006.

	BibTex	x
	@article{ 10.1109/IOLTS.2006.6, author = {Michael Nicolaidis}, title = {A Low-Cost Single-Event Latchup Mitigation Sscheme}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2006}, isbn = {0-7695-2620-9}, pages = {111-118}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.6}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - A Low-Cost Single-Event Latchup Mitigation Sscheme SN - 0-7695-2620-9 SP111 EP118 A1 - Michael Nicolaidis, PY - 2006 KW - Latchup KW - Single-event effects KW - singleevent lathcup KW - SEL KW - mitigation of single-event effects. VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

Michael Nicolaidis, TIMA Laboratory, France

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.6

Single-event latchup is one of the most threatening single event effects as the induced current may destroy the affected device. Existing latchup mitigation schemes may induce a very high area cost or may require modifying the fabrication process. In this paper we present a new single-event latchup mitigation approach implemented at design level that protects devices from destruction and preserve circuit state at very low area cost.

Index Terms:

Latchup, Single-event effects, singleevent lathcup, SEL, mitigation of single-event effects.

Citation:

Michael Nicolaidis, "A Low-Cost Single-Event Latchup Mitigation Sscheme," iolts, pp.111-118, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006

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