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12th IEEE International On-Line Testing Symposium (IOLTS'06)
Lake of Como, Italy
July 10-July 12
ISBN: 0-7695-2620-9
ASCII Text
x 
 
Andrea Cuomo, "The Challenge of Reliability in Future Complex Systems," IEEE International On-Line Testing Symposium, pp. 3, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006.
 
 
BibTex
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@article{ 10.1109/IOLTS.2006.59,
author = {Andrea Cuomo},
title = {The Challenge of Reliability in Future Complex Systems},
journal ={IEEE International On-Line Testing Symposium},
volume = {0},
year = {2006},
isbn = {0-7695-2620-9},
pages = {3},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.59},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - IEEE International On-Line Testing Symposium
TI - The Challenge of Reliability in Future Complex Systems
SN - 0-7695-2620-9
SP
EP
A1 - Andrea Cuomo,
PY - 2006
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium
ER -
 
Andrea Cuomo, STMicroelectronics
The proliferation of new terminals represents a major growth factor for the semiconductor industry. Multimedia mobile phones, game consoles, digital TV sets combine previously separated products and functions into a single box, often built around a single chip.

This convergence of devices that integrate storage, security, multimedia, mobility, connectivity and computing on the same piece of silicon represents an enormous growth opportunity for the global semiconductor industry and is focused on consumer architectures.

Citation:
Andrea Cuomo, "The Challenge of Reliability in Future Complex Systems," iolts, pp.3, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
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