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12th IEEE International On-Line Testing Symposium (IOLTS'06)
Lake of Como, Italy
July 10-July 12
ISBN: 0-7695-2620-9
Rob Aitken, ARM, Inc., USA
With ever-shrinking process technology, there is significant concern about the effects of process variability on design margins, yield, and performance. In addition, reliability is a major concern with new technology, not only through classic means such as latent defects and NBTI, but also by new issues brought on by variability, small feature sizes, and power-saving features such as dynamic supply voltage scaling. This paper shows how process scaling will affect reliability and how this interacts with ECC and redundancy features.
Citation:
Rob Aitken, "Reliability Issues for Embedded SRAM at 90nm and Below," iolts, pp.75, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
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