loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
12th IEEE International On-Line Testing Symposium (IOLTS'06)
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells
Lake of Como, Italy
July 10-July 12
ISBN: 0-7695-2620-9
ASCII Text
x 
 
G. Hubert, A. Bougerol, F. Miller, N. Buard, L. Anghel, T. Carriere, F. Wrobel, R. Gaillard, "Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells," IEEE International On-Line Testing Symposium, pp. 63-74, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006.
 
 
BibTex
x
 
@article{ 10.1109/IOLTS.2006.51,
author = {G. Hubert and A. Bougerol and F. Miller and N. Buard and L. Anghel and T. Carriere and F. Wrobel and R. Gaillard},
title = {Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells},
journal ={IEEE International On-Line Testing Symposium},
volume = {0},
year = {2006},
isbn = {0-7695-2620-9},
pages = {63-74},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.51},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - IEEE International On-Line Testing Symposium
TI - Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells
SN - 0-7695-2620-9
SP63
EP74
A1 - G. Hubert,
A1 - A. Bougerol,
A1 - F. Miller,
A1 - N. Buard,
A1 - L. Anghel,
A1 - T. Carriere,
A1 - F. Wrobel,
A1 - R. Gaillard,
PY - 2006
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium
ER -
 
G. Hubert, EADS, Corporate Research Center
A. Bougerol, EADS, Corporate Research Center
F. Miller, EADS, Corporate Research Center
N. Buard, EADS, Corporate Research Center
L. Anghel, TIMA Laboratory
T. Carriere, EADS, Space Transportation
F. Wrobel, University of Nice-Sophia Antipolis
R. Gaillard, INFODUC
This paper presents a new Monte-Carlo methodology to investigate the transient effect occurrence in Complementary Metal Oxide Semiconductor (CMOS) logic circuits: TMC DASIE (Transient Monte-Carlo Detailed Analysis of Secondary Ion Effects). The production and effects of Single-Event Transients inside CMOS combinational logic gates are examined. First results and perspectives are presented.
Citation:
G. Hubert, A. Bougerol, F. Miller, N. Buard, L. Anghel, T. Carriere, F. Wrobel, R. Gaillard, "Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells," iolts, pp.63-74, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
Usage of this product signifies your acceptance of the Terms of Use.