Power Attacks on Secure Hardware Based on Early Propagation of Data

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12th IEEE International On-Line Testing Symposium (IOLTS'06)

Lake of Como, Italy

July 10-July 12

ISBN: 0-7695-2620-9

	ASCII Text	x
	Konrad J. Kulikowski, Mark G. Karpovsky, Alexander Taubin, "Power Attacks on Secure Hardware Based on Early Propagation of Data," IEEE International On-Line Testing Symposium, pp. 131-138, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006.

	BibTex	x
	@article{ 10.1109/IOLTS.2006.49, author = {Konrad J. Kulikowski and Mark G. Karpovsky and Alexander Taubin}, title = {Power Attacks on Secure Hardware Based on Early Propagation of Data}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2006}, isbn = {0-7695-2620-9}, pages = {131-138}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.49}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - Power Attacks on Secure Hardware Based on Early Propagation of Data SN - 0-7695-2620-9 SP131 EP138 A1 - Konrad J. Kulikowski, A1 - Mark G. Karpovsky, A1 - Alexander Taubin, PY - 2006 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

Konrad J. Kulikowski, Boston University, USA

Mark G. Karpovsky, Boston University, USA

Alexander Taubin, Boston University, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.49

The early propagation effect found in many logic gates is a potential source of data-dependent power consumption. We show that the effect and the corresponding power dependency can be targeted for successful power analysis attacks in cryptographic hardware. Many of the current balanced gate designs did not directly consider the effect and are vulnerable to power analysis attacks.

Citation:

Konrad J. Kulikowski, Mark G. Karpovsky, Alexander Taubin, "Power Attacks on Secure Hardware Based on Early Propagation of Data," iolts, pp.131-138, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006

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