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12th IEEE International On-Line Testing Symposium (IOLTS'06)
Online Testing by Protocol Decomposition
Lake of Como, Italy
July 10-July 12
ISBN: 0-7695-2620-9
ASCII Text
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Deepali Koppad, Danil Sokolov, Alex Bystrov, Alex Yakovlev, "Online Testing by Protocol Decomposition," On-Line Testing Symposium, IEEE International, pp. 263-268, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006.
 
 
BibTex
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@article{ 10.1109/IOLTS.2006.45,
author = {Deepali Koppad and Danil Sokolov and Alex Bystrov and Alex Yakovlev},
title = {Online Testing by Protocol Decomposition},
journal ={On-Line Testing Symposium, IEEE International},
volume = {0},
year = {2006},
isbn = {0-7695-2620-9},
pages = {263-268},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.45},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Symposium, IEEE International
TI - Online Testing by Protocol Decomposition
SN - 0-7695-2620-9
SP263
EP268
A1 - Deepali Koppad,
A1 - Danil Sokolov,
A1 - Alex Bystrov,
A1 - Alex Yakovlev,
PY - 2006
KW - null
VL - 0
JA - On-Line Testing Symposium, IEEE International
ER -
 
Deepali Koppad, University of Newcastle upon Tyne, UK
Danil Sokolov, University of Newcastle upon Tyne, UK
Alex Bystrov, University of Newcastle upon Tyne, UK
Alex Yakovlev, University of Newcastle upon Tyne, UK
Comparison between synchronous and asynchronous models leads to a protocol-based fault model for asynchronous circuits. Protocol monitoring of the control path is separated from data comparison in the data path. A novel protocol decomposition technique is used to extract simple protocols from behaviour of a complex circuit. This technique is implemented as a software tool. An asynchronous checker model, implementation and simulation results are presented. Coverage of internal faults of the checker is calculated.
Citation:
Deepali Koppad, Danil Sokolov, Alex Bystrov, Alex Yakovlev, "Online Testing by Protocol Decomposition," iolts, pp.263-268, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006
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