From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?

I
IOLTS
2006
12th IEEE International On-Line Testing Symposium (IOLTS'06)
Abstract - From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?

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12th IEEE International On-Line Testing Symposium (IOLTS'06)

From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? (PDF)

Lake of Como, Italy

July 10-July 12

ISBN: 0-7695-2620-9

	ASCII Text	x
	Lorena Anghel, Michael Nicolaidis, Nadine Buard, "From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?," On-Line Testing Symposium, IEEE International, pp. 85, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006.

	BibTex	x
	@article{ 10.1109/IOLTS.2006.40, author = {Lorena Anghel and Michael Nicolaidis and Nadine Buard}, title = {From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2006}, isbn = {0-7695-2620-9}, pages = {85}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.40}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? SN - 0-7695-2620-9 SP EP A1 - Lorena Anghel, A1 - Michael Nicolaidis, A1 - Nadine Buard, PY - 2006 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

Lorena Anghel, TIMA

Michael Nicolaidis, TIMA

Nadine Buard, EADS-CCR

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.40

This panel will bring together a set of experts working in a collaborative project to address at both experimental measurement and simulations all levels of the process leading to system failures induced by soft errors. Several aspects will be discussed, e.g. interaction between energetic particles and the matter, detailed analysis of transient pulse generation and propagation, dependence of the circuit topology and system architecture.

Citation:

Lorena Anghel, Michael Nicolaidis, Nadine Buard, "From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?," iolts, pp.85, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006

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