12th IEEE International On-Line Testing Symposium (IOLTS'06) Lake of Como, Italy July 10-July 12 ISBN: 0-7695-2620-9
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.34
This talk focuses on the challenges and opportunities of extending Moore's Law from a radiation-induced soft error rate (SER) point of view. Driven primarily by power constraints and the economic need to scale, tomorrow's microprocessors will continue to integrate more cores and memory onto a roughly constant die area and to a lesser extend increase the clock frequency by implementing deeper pipelines and pushing the process. It is widely believed that this strategy -despite all challenges- will enable the semiconductor industry to extend Moore's Law for the next 1-2 decades.
Citation:
Norbert Seifert, "Extending Moore's Law into the next Decade - the SER Challenge," iolts, pp.7, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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