12th IEEE International On-Line Testing Symposium (IOLTS'06)
Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs
Lake of Como, Italy
July 10-July 12
ISBN: 0-7695-2620-9
This work discusses the use of two fault-tolerant techniques, duplication with self-checking and triple modular redundancy, for one-hot encoding FSM in SRAM-based techniques. The FSM encoding styles have a significant influence on the dependability of the machine in presence of bit-flips, known as Single Event Upsets (SEUs). Although the one-hot encoding style presents the best trade-off in terms of reliability, modern synthesis tools tend to optimize crucial characteristic of the one-hot style. Consequently, techniques must be applied in the hardware description language to ensure reliability of protected one-hot FSM. Results present in this paper show that fault-tolerant techniques can be easily optimized by the tools reducing the robustness of the final design. Solutions in the RTL level are proposed to ensure reliability
Citation:
Maico Cassel, Fernanda Lima Kastensmidt, "Evaluating One-Hot Encoding Finite State Machines for SEU Reliability in SRAM-based FPGAs," iolts, pp.139-144, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006