12th IEEE International On-Line Testing Symposium (IOLTS'06) Characterizing Laser-Induced Pulses in ICs: Methodology and Results Lake of Como, Italy July 10-July 12 ISBN: 0-7695-2620-9
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2006.15
Like other silicon integrated circuit (IC) domains, the smart card market is very competitive and main actors are constantly trying to design the cheapest and safest circuits to ensure their consumers' satisfaction. These specificities lead smart cards actors to design standard cell-based tamper resistant ICs and to characterize their circuits' sensitivity. In this paper, we present some experimental results aimed at characterizing the sensitivity to laser-induced transient pulses (and their duration) of elementary cells from the 0,13 ?m standard cell library STM HCMOS9GP. They were obtained for a specially designed and fabricated experimental circuit. The data obtained here allow us for better understanding of laser attacks and would be used to design integrated circuits with better protection against such attacks. The final goal of this work is to build and augment new simulation models dedicated to laser-induced faults aimed specifically at smart card industry.
Citation:
D. Leroy, S. J. Piestrak, F. Monteiro, A. Dandache, S. Rossignol, P. Moitrel, "Characterizing Laser-Induced Pulses in ICs: Methodology and Results," iolts, pp.11-16, 12th IEEE International On-Line Testing Symposium (IOLTS'06), 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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