Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics

I
IOLTS
2005
11th IEEE International On-Line Testing Symposium
Abstract - Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics

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11th IEEE International On-Line Testing Symposium

Saint Raphael, French Riviera, France

July 06-July 08

ISBN: 0-7695-2406-0

	ASCII Text	x
	Fr?d?ric Wrobel, "Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics," On-Line Testing Symposium, IEEE International, pp. 82-86, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.69, author = {Fr?d?ric Wrobel}, title = {Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {82-86}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.69}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics SN - 1530-1591 SP82 EP86 A1 - Fr?d?ric Wrobel, PY - 2005 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

Fr?d?ric Wrobel, Universit? de Nice-Sophia Antipolis

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.69

Neutron induced nuclear reactions are known to be responsible for triggering various failures in microelectronics. Nuclear codes are very useful tools, which allow estimating the production of the secondary ions and finally the way that the component is ionized. In this work we propose to give an overview of the kind of available nuclear codes. We distinguish determinist codes from Monte Carlo ones and explained why these latter are the best adapted for the study of neutron induced failures in microcircuits.

Citation:

Fr?d?ric Wrobel, "Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics," iolts, pp.82-86, 11th IEEE International On-Line Testing Symposium, 2005

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