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11th IEEE International On-Line Testing Symposium
Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics
Saint Raphael, French Riviera, France
July 06-July 08
ISBN: 0-7695-2406-0
ASCII Text
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Fr?d?ric Wrobel, "Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics," IEEE International On-Line Testing Symposium, pp. 82-86, 11th IEEE International On-Line Testing Symposium, 2005.
 
 
BibTex
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@article{ 10.1109/IOLTS.2005.69,
author = {Fr?d?ric Wrobel},
title = {Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics},
journal ={IEEE International On-Line Testing Symposium},
volume = {0},
year = {2005},
issn = {1530-1591},
pages = {82-86},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.69},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - IEEE International On-Line Testing Symposium
TI - Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics
SN - 1530-1591
SP82
EP86
A1 - Fr?d?ric Wrobel,
PY - 2005
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium
ER -
 
Fr?d?ric Wrobel, Universit? de Nice-Sophia Antipolis
Neutron induced nuclear reactions are known to be responsible for triggering various failures in microelectronics. Nuclear codes are very useful tools, which allow estimating the production of the secondary ions and finally the way that the component is ionized. In this work we propose to give an overview of the kind of available nuclear codes. We distinguish determinist codes from Monte Carlo ones and explained why these latter are the best adapted for the study of neutron induced failures in microcircuits.
Citation:
Fr?d?ric Wrobel, "Use of Nuclear Codes for Neutron-Induced Nuclear Reactions in Microelectronics," iolts, pp.82-86, 11th IEEE International On-Line Testing Symposium, 2005
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