Security Constraints in Integrated Circuits

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11th IEEE International On-Line Testing Symposium

Saint Raphael, French Riviera, France

July 06-July 08

ISBN: 0-7695-2406-0

	ASCII Text	x
	Laurent Sourgen, "Security Constraints in Integrated Circuits," On-Line Testing Symposium, IEEE International, pp. 117, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.61, author = {Laurent Sourgen}, title = {Security Constraints in Integrated Circuits}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {117}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.61}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - Security Constraints in Integrated Circuits SN - 1530-1591 SP EP A1 - Laurent Sourgen, PY - 2005 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

Laurent Sourgen, STMicroelectronics

Citation:

Laurent Sourgen, "Security Constraints in Integrated Circuits," iolts, pp.117, 11th IEEE International On-Line Testing Symposium, 2005

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