Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM

I
IOLTS
2005
11th IEEE International On-Line Testing Symposium
Abstract - Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM

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11th IEEE International On-Line Testing Symposium

Saint Raphael, French Riviera, France

July 06-July 08

ISBN: 0-7695-2406-0

	ASCII Text	x
	Balkaran Gill, Michael Nicolaidis, Chris Papachristou, "Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM," On-Line Testing Symposium, IEEE International, pp. 266-271, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.59, author = {Balkaran Gill and Michael Nicolaidis and Chris Papachristou}, title = {Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {266-271}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.59}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM SN - 1530-1591 SP266 EP271 A1 - Balkaran Gill, A1 - Michael Nicolaidis, A1 - Chris Papachristou, PY - 2005 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

Balkaran Gill, Case Western Reserve University

Michael Nicolaidis, IROC Technologies

Chris Papachristou, Case Western Reserve University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.59

In this paper, we introduce an approach for Single-word Multiple-bit Upsets (SMU) correction in SRAM. This approach uses the combination of Built in Current Sensor (BICS) and Hamming Single Error Correction/Double Error Detection (SEC/DED) codes. The BICS is used with memory columns for online detection of upsets. When the upset is detected by the BICS, an immediate error correction is performed by the ECC. If ECC gives flag for uncorrectable error i.e. double or more errors in single word, then information from BICS is used to invert the data read from columns flagged by the BICS.

Citation:

Balkaran Gill, Michael Nicolaidis, Chris Papachristou, "Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM," iolts, pp.266-271, 11th IEEE International On-Line Testing Symposium, 2005

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