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11th IEEE International On-Line Testing Symposium
Process Variation Tolerant Online Current Monitor for Robust Systems
Saint Raphael, French Riviera, France
July 06-July 08
ISBN: 0-7695-2406-0
Qikai Chen, Purdue University
Saibal Mukhopadhyay, Purdue University
Hamid Mahmoodi, Purdue University
Kaushik Roy, Purdue University
Large inter-die and intra-die process variations result in significant uncertainty in delay of circuits. Large delay variations may lead to parametric/functional failures. In this paper we propose a novel leakage-variation-tolerant online current monitor, namely leakage canceling current sensor, to detect completion of operations in logic blocks. The current monitor is applied to self-timed logic to design process variation tolerant circuits. It is observed that, for self-timed circuits, the probability of functional failures can be reduced by 50% with no performance degradation and with same power consumption.
Citation:
Qikai Chen, Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy, "Process Variation Tolerant Online Current Monitor for Robust Systems," iolts, pp.171-176, 11th IEEE International On-Line Testing Symposium, 2005
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