On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations

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	Similar Articles Articles by V. Ocheretnij Articles by G. Kouznetsov Articles by R. Karri Articles by M. G?ssel

11th IEEE International On-Line Testing Symposium

Saint Raphael, French Riviera, France

July 06-July 08

ISBN: 0-7695-2406-0

	ASCII Text	x
	V. Ocheretnij, G. Kouznetsov, R. Karri, M. G?ssel, "On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations," IEEE International On-Line Testing Symposium, pp. 141-146, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.51, author = {V. Ocheretnij and G. Kouznetsov and R. Karri and M. G?ssel}, title = {On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {141-146}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.51}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations SN - 1530-1591 SP141 EP146 A1 - V. Ocheretnij, A1 - G. Kouznetsov, A1 - R. Karri, A1 - M. G?ssel, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

V. Ocheretnij, University of Potsdam

G. Kouznetsov, University of Potsdam

R. Karri, Polytechnic University

M. G?ssel, University of Potsdam

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.51

In this paper we experimentally investigate the efficiency of concurrent checking for the AES encryption algorithm (Rijndael) by parity modification according to [3]. Also we propose a simple new BIST method. For BIST the implementation of the AES algorithm itself is used as well as a pseudo-random test input generator and a compactor of the test results. Thereby we utilized the property of the AES algorithm that arbitrarily given plain texts are encrypted by the successive rounds into "pseudo-random" cipher texts which are the (test) inputs for the next round.

The complete data path of the AES algorithm is simulated as a netlist of AND-, NAND-, OR-, NOR- and XOR-gates. All possible single stuck-at faults are injected and simulated. For a special implementation of the S-boxes all errors within the data path of the AES algorithm due to single stuck-at faults are immediately detected.

Citation:

V. Ocheretnij, G. Kouznetsov, R. Karri, M. G?ssel, "On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations," iolts, pp.141-146, 11th IEEE International On-Line Testing Symposium, 2005

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