Modeling of Transients Caused by a Laser Attack on Smart Cards

I
IOLTS
2005
11th IEEE International On-Line Testing Symposium
Abstract - Modeling of Transients Caused by a Laser Attack on Smart Cards

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11th IEEE International On-Line Testing Symposium

Modeling of Transients Caused by a Laser Attack on Smart Cards (PDF)

Saint Raphael, French Riviera, France

July 06-July 08

ISBN: 0-7695-2406-0

	ASCII Text	x
	Damien Leroy, Stanisław J. Piestrak, Fabrice Monteiro, Abbas Dandache, "Modeling of Transients Caused by a Laser Attack on Smart Cards," On-Line Testing Symposium, IEEE International, pp. 193-194, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.43, author = {Damien Leroy and Stanisław J. Piestrak and Fabrice Monteiro and Abbas Dandache}, title = {Modeling of Transients Caused by a Laser Attack on Smart Cards}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {193-194}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.43}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - Modeling of Transients Caused by a Laser Attack on Smart Cards SN - 1530-1591 SP193 EP194 A1 - Damien Leroy, A1 - Stanisław J. Piestrak, A1 - Fabrice Monteiro, A1 - Abbas Dandache, PY - 2005 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

Damien Leroy, iRoC Technologies SA

Stanisław J. Piestrak, University of Metz

Fabrice Monteiro, University of Metz

Abbas Dandache, University of Metz

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.43

Several techniques for extracting data from smart cards have been described in the literature, including the so called differential fault analysis (DFA) that relies on perturbing the chip operations to deduce the data. In this paper, we present some experimental results of the DFA that relies on using a laser beam.

Citation:

Damien Leroy, Stanisław J. Piestrak, Fabrice Monteiro, Abbas Dandache, "Modeling of Transients Caused by a Laser Attack on Smart Cards," iolts, pp.193-194, 11th IEEE International On-Line Testing Symposium, 2005

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