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11th IEEE International On-Line Testing Symposium
Mitigating Soft Errors to Prevent a Hard Threat to Dependable Computing
Saint Raphael, French Riviera, France
July 06-July 08
ISBN: 0-7695-2406-0
ASCII Text
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Yves Crouzet, Jacques Collet, Jean Arlat, "Mitigating Soft Errors to Prevent a Hard Threat to Dependable Computing," On-Line Testing Symposium, IEEE International, pp. 295-298, 11th IEEE International On-Line Testing Symposium, 2005.
 
 
BibTex
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@article{ 10.1109/IOLTS.2005.42,
author = {Yves Crouzet and Jacques Collet and Jean Arlat},
title = {Mitigating Soft Errors to Prevent a Hard Threat to Dependable Computing},
journal ={On-Line Testing Symposium, IEEE International},
volume = {0},
year = {2005},
issn = {1530-1591},
pages = {295-298},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.42},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - On-Line Testing Symposium, IEEE International
TI - Mitigating Soft Errors to Prevent a Hard Threat to Dependable Computing
SN - 1530-1591
SP295
EP298
A1 - Yves Crouzet,
A1 - Jacques Collet,
A1 - Jean Arlat,
PY - 2005
KW - null
VL - 0
JA - On-Line Testing Symposium, IEEE International
ER -
 
Yves Crouzet, LAAS-CNRS
Jacques Collet, LAAS-CNRS
Jean Arlat, LAAS-CNRS
This paper presents first the context and motivation for dealing with soft errors. In order to be able to account for the various issues involved, a concerted reflection has been carried out including embedded system integrators, manufacturers, and academic researchers. We summarize the main outcomes of this effort. Finally, we introduce the various contributions that are meant to address the several factors that characterize the problem posed by soft errors and provide solutions to mitigate their effects.
Citation:
Yves Crouzet, Jacques Collet, Jean Arlat, "Mitigating Soft Errors to Prevent a Hard Threat to Dependable Computing," iolts, pp.295-298, 11th IEEE International On-Line Testing Symposium, 2005
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