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11th IEEE International On-Line Testing Symposium
Fast, Parallel Two-Rail Code Checker with Enhanced Testability
Saint Raphael, French Riviera, France
July 06-July 08
ISBN: 0-7695-2406-0
S. Matakias, University of Athens
Y. Tsiatouhas, University of Ioannina
Th. Haniotakis, Southern Illinois University
A. Arapoyanni, University of Athens
A. Efthymiou, University of Athens
A current mode, periodic outputs, parallel two-rail code (TRC) checker, suitable for high n-variable (high fan-in) implementations, is presented. The new checker is characterised by high testability, high operating frequencies and low silicon area requirements. The circuit has been designed, for various n-variable values, in a 0.18?m technology and SPICE simulations have been carried out to validate its operation.
Citation:
S. Matakias, Y. Tsiatouhas, Th. Haniotakis, A. Arapoyanni, A. Efthymiou, "Fast, Parallel Two-Rail Code Checker with Enhanced Testability," iolts, pp.149-156, 11th IEEE International On-Line Testing Symposium, 2005
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