Evaluation of SET and SEU Effects at Multiple Abstraction Levels

I
IOLTS
2005
11th IEEE International On-Line Testing Symposium
Abstract - Evaluation of SET and SEU Effects at Multiple Abstraction Levels

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11th IEEE International On-Line Testing Symposium

Saint Raphael, French Riviera, France

July 06-July 08

ISBN: 0-7695-2406-0

	ASCII Text	x
	L. Anghel, R. Leveugle, P. Vanhauwaert, "Evaluation of SET and SEU Effects at Multiple Abstraction Levels," On-Line Testing Symposium, IEEE International, pp. 309-312, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.28, author = {L. Anghel and R. Leveugle and P. Vanhauwaert}, title = {Evaluation of SET and SEU Effects at Multiple Abstraction Levels}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {309-312}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.28}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - Evaluation of SET and SEU Effects at Multiple Abstraction Levels SN - 1530-1591 SP309 EP312 A1 - L. Anghel, A1 - R. Leveugle, A1 - P. Vanhauwaert, PY - 2005 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

L. Anghel, TIMA Laboratory

R. Leveugle, TIMA Laboratory

P. Vanhauwaert, TIMA Laboratory

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.28

This paper reviews the main approaches used to evaluate the effect of Single Event Transients and Single Event Upsets in digital circuits described at different abstraction levels. The two fault models are first discussed with respect to the circuit description levels, then complementary dependability evaluation methods are summarized.

Citation:

L. Anghel, R. Leveugle, P. Vanhauwaert, "Evaluation of SET and SEU Effects at Multiple Abstraction Levels," iolts, pp.309-312, 11th IEEE International On-Line Testing Symposium, 2005

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