Electrical Modeling for Laser Testing with Different Pulse Durations

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by A. Douin Articles by V. Pouget Articles by D. Lewis Articles by P. Fouillat Articles by P. Perdu

11th IEEE International On-Line Testing Symposium

Saint Raphael, French Riviera, France

July 06-July 08

ISBN: 0-7695-2406-0

	ASCII Text	x
	A. Douin, V. Pouget, D. Lewis, P. Fouillat, P. Perdu, "Electrical Modeling for Laser Testing with Different Pulse Durations," IEEE International On-Line Testing Symposium, pp. 9-13, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.27, author = {A. Douin and V. Pouget and D. Lewis and P. Fouillat and P. Perdu}, title = {Electrical Modeling for Laser Testing with Different Pulse Durations}, journal ={IEEE International On-Line Testing Symposium}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {9-13}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.27}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - IEEE International On-Line Testing Symposium TI - Electrical Modeling for Laser Testing with Different Pulse Durations SN - 1530-1591 SP9 EP13 A1 - A. Douin, A1 - V. Pouget, A1 - D. Lewis, A1 - P. Fouillat, A1 - P. Perdu, PY - 2005 KW - null VL - 0 JA - IEEE International On-Line Testing Symposium ER -

A. Douin, Universit? Bordeaux 1

V. Pouget, Universit? Bordeaux 1

D. Lewis, Universit? Bordeaux 1

P. Fouillat, Universit? Bordeaux 1

P. Perdu, CNES

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.27

This paper presents a simple electrical model of laser-induced currents in a single MOS transistor for different laser pulse durations. This model is validated by mixed-mode device simulations of a laser-induced fault in an SRAM cell for different laser pulse durations ranging from 100fs to 10ns. This model can be used for netlist level simulation of pulsed laser online testing in the context of radiation hardening, semi-invasive attacks, or more generally, hardware level fault injection techniques.

Citation:

A. Douin, V. Pouget, D. Lewis, P. Fouillat, P. Perdu, "Electrical Modeling for Laser Testing with Different Pulse Durations," iolts, pp.9-13, 11th IEEE International On-Line Testing Symposium, 2005

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.