Efficient Estimation of SEU Effects in SRAM-Based FPGAs

I
IOLTS
2005
11th IEEE International On-Line Testing Symposium
Abstract - Efficient Estimation of SEU Effects in SRAM-Based FPGAs

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11th IEEE International On-Line Testing Symposium

Saint Raphael, French Riviera, France

July 06-July 08

ISBN: 0-7695-2406-0

	ASCII Text	x
	M. Sonza Reorda, L. Sterpone, M. Violante, "Efficient Estimation of SEU Effects in SRAM-Based FPGAs," On-Line Testing Symposium, IEEE International, pp. 54-59, 11th IEEE International On-Line Testing Symposium, 2005.

	BibTex	x
	@article{ 10.1109/IOLTS.2005.26, author = {M. Sonza Reorda and L. Sterpone and M. Violante}, title = {Efficient Estimation of SEU Effects in SRAM-Based FPGAs}, journal ={On-Line Testing Symposium, IEEE International}, volume = {0}, year = {2005}, issn = {1530-1591}, pages = {54-59}, doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.26}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - On-Line Testing Symposium, IEEE International TI - Efficient Estimation of SEU Effects in SRAM-Based FPGAs SN - 1530-1591 SP54 EP59 A1 - M. Sonza Reorda, A1 - L. Sterpone, A1 - M. Violante, PY - 2005 KW - null VL - 0 JA - On-Line Testing Symposium, IEEE International ER -

M. Sonza Reorda, Politecnico di Torino

L. Sterpone, Politecnico di Torino

M. Violante, Politecnico di Torino

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.26

SRAM-based FPGAs are becoming very appealing for several applications where high dependability is a mandatory requirement. Unfortunately, the technology of SRAM-based FPGAs is very sensitive to Single Event Upsets (SEUs) and particular concerns arise from SEUs affecting the FPGAs? configuration memory. In this paper we propose a new method for assessing the impact of faults in the configuration memory on the FPGA dependability. The method uses static analysis, thus reducing greatly the time for performing dependability evaluation.

Citation:

M. Sonza Reorda, L. Sterpone, M. Violante, "Efficient Estimation of SEU Effects in SRAM-Based FPGAs," iolts, pp.54-59, 11th IEEE International On-Line Testing Symposium, 2005

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