T. M. Mak, Subhasish Mitra, Ming Zhang, "DFT Assisted Built-In Soft Error Resilience," IEEE International On-Line Testing Symposium, pp. 69, 11th IEEE International On-Line Testing Symposium, 2005.

@article{ 10.1109/IOLTS.2005.23,
author = {T. M. Mak and Subhasish Mitra and Ming Zhang},
title = {DFT Assisted Built-In Soft Error Resilience},
journal ={IEEE International On-Line Testing Symposium},
volume = {0},
year = {2005},
issn = {1530-1591},
pages = {69},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.23},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - IEEE International On-Line Testing Symposium
TI - DFT Assisted Built-In Soft Error Resilience
SN - 1530-1591
SP
EP
A1 - T. M. Mak,
A1 - Subhasish Mitra,
A1 - Ming Zhang,
PY - 2005
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium
ER -