Michael Nicolaidis, "Design for Mitigation of Single Event Effects," On-Line Testing Symposium, IEEE International, pp. 95-96, 11th IEEE International On-Line Testing Symposium, 2005.

@article{ 10.1109/IOLTS.2005.20,
author = {Michael Nicolaidis},
title = {Design for Mitigation of Single Event Effects},
journal ={On-Line Testing Symposium, IEEE International},
volume = {0},
year = {2005},
issn = {1530-1591},
pages = {95-96},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.20},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - On-Line Testing Symposium, IEEE International
TI - Design for Mitigation of Single Event Effects
SN - 1530-1591
SP95
EP96
A1 - Michael Nicolaidis,
PY - 2005
KW - null
VL - 0
JA - On-Line Testing Symposium, IEEE International
ER -