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11th IEEE International On-Line Testing Symposium
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding
Saint Raphael, French Riviera, France
July 06-July 08
ISBN: 0-7695-2406-0
ASCII Text
x 
 
G. Hubert, N. Buard, C. Weulersse, T. Carriere, M.-C. Palau, J.-M. Palau, D. Lambert, J. Baggio, F. Wrobel, F. Saigne, R. Gaillard, "A Review of DASIE Code Family: Contribution to SEU/MBU Understanding," IEEE International On-Line Testing Symposium, pp. 87-94, 11th IEEE International On-Line Testing Symposium, 2005.
 
 
BibTex
x
 
@article{ 10.1109/IOLTS.2005.12,
author = {G. Hubert and N. Buard and C. Weulersse and T. Carriere and M.-C. Palau and J.-M. Palau and D. Lambert and J. Baggio and F. Wrobel and F. Saigne and R. Gaillard},
title = {A Review of DASIE Code Family: Contribution to SEU/MBU Understanding},
journal ={IEEE International On-Line Testing Symposium},
volume = {0},
year = {2005},
issn = {1530-1591},
pages = {87-94},
doi = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.12},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - IEEE International On-Line Testing Symposium
TI - A Review of DASIE Code Family: Contribution to SEU/MBU Understanding
SN - 1530-1591
SP87
EP94
A1 - G. Hubert,
A1 - N. Buard,
A1 - C. Weulersse,
A1 - T. Carriere,
A1 - M.-C. Palau,
A1 - J.-M. Palau,
A1 - D. Lambert,
A1 - J. Baggio,
A1 - F. Wrobel,
A1 - F. Saigne,
A1 - R. Gaillard,
PY - 2005
KW - null
VL - 0
JA - IEEE International On-Line Testing Symposium
ER -
 
G. Hubert, EADS, Corporate Research Center
N. Buard, EADS, Corporate Research Center
C. Weulersse, EADS, Corporate Research Center
T. Carriere, EADS, Space Transportation
M.-C. Palau, EADS, Space Transportation
J.-M. Palau, University of Montpellier
D. Lambert, CEA/DAM
J. Baggio, CEA/DAM
F. Wrobel, University of Nice
F. Saigne, University of Montpellier
R. Gaillard, NFODUC
DASIE (the Detailed Analysis of Secondary Ion Effect) is the name of a code family dedicated to the SEE rate prediction. This paper presents a review of DASIE code family and its contributions to SEU (Single Event Upset) and MBU (Multiple Bit Upset) understanding.
Citation:
G. Hubert, N. Buard, C. Weulersse, T. Carriere, M.-C. Palau, J.-M. Palau, D. Lambert, J. Baggio, F. Wrobel, F. Saigne, R. Gaillard, "A Review of DASIE Code Family: Contribution to SEU/MBU Understanding," iolts, pp.87-94, 11th IEEE International On-Line Testing Symposium, 2005
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