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18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05)
Structural Fault Diagnosis in Charge-Pump Based Phase-Locked Loops
Kolkata, India
January 03-January 07
ISBN: 0-7695-2264-5
ASCII Text
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AdityaSankar Medury, Ingvar Carlson, Atila Alvandpour, John Stensby, "Structural Fault Diagnosis in Charge-Pump Based Phase-Locked Loops," VLSI Design, International Conference on, pp. 842-845, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05), 2005.
 
 
BibTex
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@article{ 10.1109/ICVD.2005.153,
author = {AdityaSankar Medury and Ingvar Carlson and Atila Alvandpour and John Stensby},
title = {Structural Fault Diagnosis in Charge-Pump Based Phase-Locked Loops},
journal ={VLSI Design, International Conference on},
volume = {0},
year = {2005},
issn = {1063-9667},
pages = {842-845},
doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2005.153},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Design, International Conference on
TI - Structural Fault Diagnosis in Charge-Pump Based Phase-Locked Loops
SN - 1063-9667
SP842
EP845
A1 - AdityaSankar Medury,
A1 - Ingvar Carlson,
A1 - Atila Alvandpour,
A1 - John Stensby,
PY - 2005
KW - null
VL - 0
JA - VLSI Design, International Conference on
ER -
 
AdityaSankar Medury, University of Alabama at Huntsville
Ingvar Carlson, Link?ping University
Atila Alvandpour, Link?ping University
John Stensby, University of Alabama at Huntsville
An approach is presented for identifying structural-faults, using the charge-frequency based built-in-self test (CF-BIST) technique in a phase-locked loop (PLL) circuit, for a standard 0.18 µm CMOS process. This method not only validated the CF-BIST approach for fault detection, but also showed an algorithm for how this approach may possibly be used for fault diagnosis as well, for a wide frequency PLL. The method of fault diagnosis is based on measuring the 8-bit digital values from the voltage-controlled oscillator (VCO)/Divide-by-N counter and performing comparisons between the values for the fault-free and fault-introduced conditions.
Citation:
AdityaSankar Medury, Ingvar Carlson, Atila Alvandpour, John Stensby, "Structural Fault Diagnosis in Charge-Pump Based Phase-Locked Loops," vlsid, pp.842-845, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design (VLSID'05), 2005
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