Concurrent RF Test Using Optimized Modulated RF Stimuli

V
VLSID
2004
17th International Conference on VLSI Design
Abstract - Concurrent RF Test Using Optimized Modulated RF Stimuli

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	Similar Articles Articles by Sasikumar Cherubal Articles by Ram Voorakaranam Articles by Abhijit Chatterjee Articles by John Mclaughlin Articles by Jason L. Smith Articles by David M. Majernik

17th International Conference on VLSI Design

Mumbai, India

January 05-January 09

ISBN: 0-7695-2072-3

	ASCII Text	x
	Sasikumar Cherubal, Ram Voorakaranam, Abhijit Chatterjee, John Mclaughlin, Jason L. Smith, David M. Majernik, "Concurrent RF Test Using Optimized Modulated RF Stimuli," VLSI Design, International Conference on, pp. 1017, 17th International Conference on VLSI Design, 2004.

	BibTex	x
	@article{ 10.1109/ICVD.2004.1261063, author = {Sasikumar Cherubal and Ram Voorakaranam and Abhijit Chatterjee and John Mclaughlin and Jason L. Smith and David M. Majernik}, title = {Concurrent RF Test Using Optimized Modulated RF Stimuli}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2004}, issn = {1063-9667}, pages = {1017}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2004.1261063}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Concurrent RF Test Using Optimized Modulated RF Stimuli SN - 1063-9667 SP EP A1 - Sasikumar Cherubal, A1 - Ram Voorakaranam, A1 - Abhijit Chatterjee, A1 - John Mclaughlin, A1 - Jason L. Smith, A1 - David M. Majernik, PY - 2004 KW - null VL - 0 JA - VLSI Design, International Conference on ER -

Sasikumar Cherubal, Ardext Technologies, Tucson, AZ

Ram Voorakaranam, Ardext Technologies, Tucson, AZ

Abhijit Chatterjee, Georgia Institute of Technology, Atlanta

John Mclaughlin, Agilent Technologies, Santa Rosa, CA

Jason L. Smith, Agilent Technologies, Santa Rosa, CA

David M. Majernik, Arctic Systems, Inc, Burtonsville, MD

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.2004.1261063

With proliferation in wireless applications, RF circuitry is being included in a large number of Integrated Circuit (IC) designs. The testing of RF devices has become increasingly expensive due to the high cost of RF testers as well as the test times for RF circuits. The use of a new concurrent test methodology reduces RF test time by measuring multiple RF parameters in parallel using modulated RF stimuli. Experimental results on a GaAs Low-Noise Amplifier (LNA) are described.

Citation:

Sasikumar Cherubal, Ram Voorakaranam, Abhijit Chatterjee, John Mclaughlin, Jason L. Smith, David M. Majernik, "Concurrent RF Test Using Optimized Modulated RF Stimuli," vlsid, pp.1017, 17th International Conference on VLSI Design, 2004

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