17th International Conference on VLSI Design Dynamic Noise Margin: Definitions and Model Mumbai, India January 05-January 09 ISBN: 0-7695-2072-3
Dynamic noise analysis is greatly needed in place of traditional static noise analysis due to the ever increasingly stringent design requirement for VLSI chips based on very deep submicron process technology. In this paper, we propose complete and self-consistent dynamic noise margin definitions to reduce the pessimism of conventional static noise margin based noise analysis. A simple and accurate dynamic noise margin model is then developed based on a new figure of merit, which is the ratio between the input noise duration and the sum of gate load capacitance and gate intrinsic capacitance. An efficient dynamic noise margin based noise analysis method is presented.
Citation:
Li Ding, Pinaki Mazumder, "Dynamic Noise Margin: Definitions and Model," vlsid, pp.1001, 17th International Conference on VLSI Design, 2004 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||