Exclusive Test and its Applications to Fault Diagnosis

V
VLSID
2003
16th International Conference on VLSI Design
Abstract - Exclusive Test and its Applications to Fault Diagnosis

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16th International Conference on VLSI Design

New Delhi, India

January 04-January 08

ISBN: 0-7695-1868-0

	ASCII Text	x
	Vishwani D. Agrawal, Dong Hyun Baik, Yong Chang Kim, Kewal K. Saluja, "Exclusive Test and its Applications to Fault Diagnosis," VLSI Design, International Conference on, pp. 143, 16th International Conference on VLSI Design, 2003.

	BibTex	x
	@article{ 10.1109/ICVD.2003.1183128, author = {Vishwani D. Agrawal and Dong Hyun Baik and Yong Chang Kim and Kewal K. Saluja}, title = {Exclusive Test and its Applications to Fault Diagnosis}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2003}, issn = {1063-9667}, pages = {143}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183128}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Exclusive Test and its Applications to Fault Diagnosis SN - 1063-9667 SP EP A1 - Vishwani D. Agrawal, A1 - Dong Hyun Baik, A1 - Yong Chang Kim, A1 - Kewal K. Saluja, PY - 2003 KW - null VL - 0 JA - VLSI Design, International Conference on ER -

Vishwani D. Agrawal, Agere Systems

Dong Hyun Baik, University of Wisconsin-Madison

Yong Chang Kim, University of Wisconsin-Madison

Kewal K. Saluja, University of Wisconsin-Madison

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183128

We introduce a new type of test, called exclusive test, und discuss its application to fault diagnosis in combinational circuits. A test that detects exactly one fault from a given pair of faults is called an exclusive test. In general, generation of an exclusive test by a conventional automatic test generator requires a model of the circuit with multiple-faults. We describe an ATPG model that transforms the exclusive test problem into a single-fault test generation problem. We present a generalized diagnostic method and illustrate the use of exclusive tests in improving the diagnostic resolution of a test set. Results of diagnosis with exclusive tests for ISCAS85 bencmark circuits are included.

Citation:

Vishwani D. Agrawal, Dong Hyun Baik, Yong Chang Kim, Kewal K. Saluja, "Exclusive Test and its Applications to Fault Diagnosis," vlsid, pp.143, 16th International Conference on VLSI Design, 2003

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