The 14th International Conference on VLSI Design (VLSID '01) Crosstalk Noise Verification in Digital Designs with Interconnect Process Variations Bangalore, India January 03-January 07 ISBN: 0-7695-0831-6
Interconnect parasitics are playing a significant role in design and analysis in deep sub-micron (DSM) technologies. Interconnect process variations could play a significant role in achieving predictable yield. Crosstalk noise is one of the increasingly important careabouts in DSM designs. In this paper, a practical method to analyze the crosstalk noise effects with interconnect process variations using corner-based approach is described. The results from application of this method on a large DSP design implemented in 0.18u technology is presented. Application of the proposed method resulted in detection of a new worstcase interconnect process corner that was not included in the design methodology.
Citation:
Nagaraj Ns, Poras Balsara, Cyrus Cantrell, "Crosstalk Noise Verification in Digital Designs with Interconnect Process Variations," vlsid, pp.365, The 14th International Conference on VLSI Design (VLSID '01), 2001 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||