Test Transformation to Improve Compaction by Statistical Encoding

V
VLSID
2000
13th International Conference on VLSI Design
Abstract - Test Transformation to Improve Compaction by Statistical Encoding

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13th International Conference on VLSI Design

Calcutta, India

January 04-January 07

ISBN: 0-7695-0487-6

	ASCII Text	x
	Hideyuki Ichihara, Kozo Kinoshita, Irith Pomeranz, Sudhakar M. Reddy, "Test Transformation to Improve Compaction by Statistical Encoding," VLSI Design, International Conference on, pp. 294, 13th International Conference on VLSI Design, 2000.

	BibTex	x
	@article{ 10.1109/ICVD.2000.812624, author = {Hideyuki Ichihara and Kozo Kinoshita and Irith Pomeranz and Sudhakar M. Reddy}, title = {Test Transformation to Improve Compaction by Statistical Encoding}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {2000}, issn = {1063-9667}, pages = {294}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2000.812624}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Test Transformation to Improve Compaction by Statistical Encoding SN - 1063-9667 SP EP A1 - Hideyuki Ichihara, A1 - Kozo Kinoshita, A1 - Irith Pomeranz, A1 - Sudhakar M. Reddy, PY - 2000 KW - test compression KW - statistical code KW - fault simulation VL - 0 JA - VLSI Design, International Conference on ER -

Hideyuki Ichihara, Osaka University

Kozo Kinoshita, Osaka University

Irith Pomeranz, University of Iowa

Sudhakar M. Reddy, University of Iowa

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.2000.812624

In test compression / decompression schemes the objective is to achieve the highest compression without sacrificing fault coverage. In this paper, we propose a method to transform a test set in order to achieve higher compression without sacrificing fault coverage, while using statistical encoding techniques. The compression ratio of a test set depends on the entropy of the test set, and hence our test transformation method decreases the entropy of the test set without losing the fault coverage. Experimental results show that the proposed method transforms given test sets into highly compressible ones.

Index Terms:

test compression, statistical code, fault simulation

Citation:

Hideyuki Ichihara, Kozo Kinoshita, Irith Pomeranz, Sudhakar M. Reddy, "Test Transformation to Improve Compaction by Statistical Encoding," vlsid, pp.294, 13th International Conference on VLSI Design, 2000

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