Empirical Computation of Reject Ratio in VLSI Testing

V
VLSID
1999
12th International Conference on VLSI Design - 'VLSI for the Information Appliance'
Abstract - Empirical Computation of Reject Ratio in VLSI Testing

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	Similar Articles Articles by Shashank K. Mehta Articles by Sharad C. Seth

12th International Conference on VLSI Design - 'VLSI for the Information Appliance'

Goa, India

January 10-January 13

ISBN: 0-7695-0013-7

	ASCII Text	x
	Shashank K. Mehta, Sharad C. Seth, "Empirical Computation of Reject Ratio in VLSI Testing," VLSI Design, International Conference on, pp. 506, 12th International Conference on VLSI Design - 'VLSI for the Information Appliance', 1999.

	BibTex	x
	@article{ 10.1109/ICVD.1999.745205, author = {Shashank K. Mehta and Sharad C. Seth}, title = {Empirical Computation of Reject Ratio in VLSI Testing}, journal ={VLSI Design, International Conference on}, volume = {0}, year = {1999}, issn = {1063-9667}, pages = {506}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1999.745205}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Design, International Conference on TI - Empirical Computation of Reject Ratio in VLSI Testing SN - 1063-9667 SP EP A1 - Shashank K. Mehta, A1 - Sharad C. Seth, PY - 1999 VL - 0 JA - VLSI Design, International Conference on ER -

Shashank K. Mehta, University of Nebraska-Lincoln

Sharad C. Seth, University of Nebraska-Lincoln

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICVD.1999.745205

Among significant components of testing cost are test-length, reject ratio, and lost-yield. In this paper a new approach is proposed to estimate the reject ratio. The empirical model is based on test-data properties that are believed to be invariant for a wide range of manufacturing technologies and types of tests. The analysis is carried out entirely in terms of the device test data, as might be available from wafer probe. Experimental results demonstrate robustness of the model.

Citation:

Shashank K. Mehta, Sharad C. Seth, "Empirical Computation of Reject Ratio in VLSI Testing," vlsid, pp.506, 12th International Conference on VLSI Design - 'VLSI for the Information Appliance', 1999

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