12th International Conference on VLSI Design - 'VLSI for the Information Appliance'
Modeling Crosstalk in Resistive VLSI Interconnections
Goa, India
January 10-January 13
ISBN: 0-7695-0013-7
We address the problem of crosstalk computation and reduction using circuit and layout techniques in this paper. We provide easily computable expressions for crosstalk amplitude and pulse width in resistive, capacitively coupled lines. The expressions hold for nets with arbitrary number of pins and arbitrary topology. Experimental results show that the average error is about 10% and the maximum error is less than 20%. The expressions are used to motivate circuit techniques such as transistor sizing, and layout techniques such as wire ordering and wire width optimization to reduce crosstalk.
Citation:
A. Vittal, L.H. Chen, M. Marek-Sadowska, K.-P. Wang, S. Yang, "Modeling Crosstalk in Resistive VLSI Interconnections," vlsid, pp.470, 12th International Conference on VLSI Design - 'VLSI for the Information Appliance', 1999