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Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Faster Fault Simulation Through Distributed Computing
Hyderabad, India
January 04-January 07
ISBN: 0-8186-7755-4
C.P. Ravikumar, Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
V. Jain, Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
A. Dod, Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
In this paper, we describe distributed algorithms for combinational fault simulation assuming the classical stuck-at fault model. Our algorithms have been implemented on a network of Sun workstations under the Parallel Virtual Machine (PVM) environment. Two techniques are used for subdividing work among processors -test set partition and fault set partition. The sequential algorithm for fault simulation, used on individual nodes of the network, is based on a novel path compression technique proposed in this paper. We describe experimental results on a number of ISCAS '85 benchmark circuits.
Index Terms:
combinational circuits, combinational fault simulation, distributed algorithms, distributed computing, classical stuck-at fault model, Sun workstation network, parallel virtual machine environment, test set partition, fault set partition, sequential algorithm, path compression technique, ISCAS '85 benchmark circuits
Citation:
C.P. Ravikumar, V. Jain, A. Dod, "Faster Fault Simulation Through Distributed Computing," vlsid, pp.482, Tenth International Conference on VLSI Design: VLSI in Multimedia Applications, 1997
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